Presentations
Up one level- Acceptance of test results from Manufacturers' Test Laboratories (MTL) — by Luis Mussio, BIML — last modified 2011-10-12 13:21
- Presented by Roman Schwartz
- Approval of revised versions of OIML Certificate System Documents B 3 and B 10 — by Luis Mussio, BIML — last modified 2011-10-12 13:21
- Presented by Charles Ehrlich
- Revision of the SI — by Luis Mussio, BIML — last modified 2011-10-12 13:21
- Presented by Arnold Leitner
- OIML Award 2011 — by Luis Mussio, BIML — last modified 2011-10-12 13:22
- Presented by Eberhard Seiler
- BIPM Report to the 46th CIML — by Luis Mussio, BIML — last modified 2011-10-12 13:23
- Presented by Andy Henson
- ILAC - IAF Latest Developments — by Luis Mussio, BIML — last modified 2011-10-12 13:27
- Presented by Merih Malmqvist Nilsson
- CECIP Report — by Luis Mussio, BIML — last modified 2011-10-12 13:28
- Presented by Veronica Martens
- Round Table with Regional Bodies 2011 — by Luis Mussio, BIML — last modified 2011-10-12 13:32
- Presented by Pavel Neyezhmakov
- OIML Award for Excellent Contribution for Legal Metrology in Developing Country — by Luis Mussio, BIML — last modified 2011-10-12 13:34
- Presented by Osama MELHEM
- Cost implications of the proposed international system for the certification of prepackages — by Chris Pulham, BIML — last modified 2011-10-15 16:32
- Presented by Stuart Carstens
- Revision of the SI — by Chris Pulham, BIML — last modified 2011-10-15 16:34
- Presented by Arnold Leitner
- New SI - Possible consequences for “practical metrology” — by Chris Pulham, BIML — last modified 2011-10-15 16:35
- Presented by Philippe Richard
- Report on Conformity to Type (CTT): CIML Item 10.4 — by Chris Pulham, BIML — last modified 2011-10-15 16:36
- Presented by Stephen O'Brien